透射电镜原位纳米操纵样品杆,原位电学样品杆

美国蜂鸟科技原位纳米操纵样品杆允许科学家在进行高分辨率图像观察的同时进行原子尺度的3维操纵和电学测试。该样品杆利用一个3轴探针操纵和偏压样品。利用粗动和微动的结合定位,该样品杆可实现样品和探针原子尺度的稳定性。

1800 Series  
Range of Motion
  
   X-axis (coarse, fine)
 ±0.5 mm, 50 μm 
   Y-axis (coarse, fine)
 ±0.5 mm, 50 μm 
   Z-axis (coarse, fine)
 5 mm, 5 μm 
Number of Electrical Contacts
 2 (available up to 7) 
Coarse Stage Positioning Resolution
 1 μm 
Fine Stage Positioning Resolution
 < 1 nm 
Wiring Individually Shielded 
Current Measurement Resolution Down to 10 pA (depending on measurement equipment) 
Sample Geometry 3 mm half grid bulk, half grid FIB lift out or half grid membrane samples*